In today’s world, even the smallest details can help unlock big discoveries. As such, scientists and researchers continually seek ways to explore the microscopic world around us. This is where atomic force microscopy (AFM) comes in. AFM enables the study of materials with incredible precision, thereby revealing secrets hidden in the tiny world of atoms and molecules.
AFM finds applications in several fields, from nanotechnology to biology. It allows scientists to understand how cells function or how materials behave at the smallest scales. Curious how AFM helps unlock mysteries of the microscopic world? Continue reading as we delve into the fundamentals of AFM and illuminate the key factors that will shape the future of the atomic force microscopy market.
The discipline of scanning probe microscopy (SPM) started in the early 1980s with the introduction of the scanning tunneling microscope (STM) by Heinrich Rohrer and Gerd Binnig. Their creation led to them winning the 1986 Nobel Prize for their contributions to physics. In the same year, Gerd Binnig, along with his colleagues, made a major advance with the development of the atomic force microscope, a highly advanced microscope type. Since its introduction, the AFM has revolutionized nanoscale characterization and measurement.
AFM is the most prevalent type of SPM today. As such, the terms are often used interchangeably. SPM is a broader category of microscopy techniques that use a physical probe to scan a surface and create images. AFM is a specific type of SPM that uses a sharp tip attached to a cantilever to detect forces.
SPM has seen a significant expansion beyond its initial applications since the invention of AFM and the Nobel Prize-winning scanning tunneling microscope (STM). The landmark publication by Gerber, Quate, and Binnig played a pivotal role, driving the development of various SPM techniques for characterizing diverse material properties at the nanoscale.
AFM is a high-resolution imaging technology that enables scientists to visualize and measure surfaces at the atomic or nanometer scale. It encompasses various non-destructive testing techniques employed at the nanoscale. The resolution of these AFM techniques is 103 times higher than the resolution limit of optical microscopy. AFM is typically used for collecting data on electrical, functional, and mechanical properties at the nanoscale. It also finds uses in topography research.
With rising investments in nanotechnology research and the increased focus of the semiconductor and electronics industries on developing more efficient devices, atomic force microscopy is witnessing growing demand. Our latest analysis reveals that the atomic force microscopy market is expected to register a CAGR of 7.4% from 2025 to 2034, reaching a valuation of USD 1,044.95 million by 2034.
AFM microscopes operate on the principle of surface sensing. Surface sensing is performed using a highly sharp tip on a micromachined silicon probe. The movement of the tip over the surface follows a pattern, just like the movement of the needle across a vinyl record. The tip measures how the surface reacts as it touches it. Below, we’ve explained a more detailed working of the same:
The Tip: The tip carries a highly sharp probe. The probe is usually made of silicon or silicon nitride and attached to a flexible arm. The arm can bend a little when it interacts with the sample’s surface.
Scanning: As mentioned earlier, the probe moves over the surface in a grid-like pattern, which is referred to as raster scanning. As the probe moves, it gets closer and touches the surface of the sample. Then it measures the forces at the tip and the sample. With these forces, the cantilever can bend or reflect.
Detection: The cantilever’s back is equipped with a laser beam. This laser reflects off the cantilever and hits a detector, called a photodiode. The cantilever’s bending causes the laser spot to move. The detector measures this movement. The computer then uses this movement data to build a profile or map of the surface’s features, down to the nanometer scale.
Understanding Forces: The interaction between the sample and the tip is governed by the forces at the sharp end of the tip. These forces can cause the cantilever to bend or deflect. The ability of AFM to measure these small movements enables it to develop a highly precise map of the sample’s surface. They include factors such as texture, height, and even chemical properties at a very small scale.
AFM is a form of microscopy that offers detailed observations at the nanoscale. Below, we’ve listed some of its uses:
Surface Topography: AFMs excel at developing three-dimensional images of surfaces with high resolution. Their use reveals features at the atomic and molecular level.
Mechanical Properties: AFMs can measure the stiffness, elasticity, and adhesion of materials. Their use provides insights into the mechanical behavior.
Nanoscale Imaging: AFMs can image a wide range of materials, including semiconductors, polymers, and biological samples, with high resolution.
Dynamics Studies: They can be used to observe changes in surface properties and interactions in real-time. This makes them useful for studying dynamic processes, such as cell adhesion or protein folding.
Electrical and Magnetic Properties: Some AFM models enable the measurement of electrical conductivity and magnetic properties at the nanoscale.
Chemical and Biological Interactions: AFMs can be used to study interactions between molecules and to investigate the behavior of cells and tissues.
Atomic force microscopy has revolutionized our understanding of the world at the nanoscale. Its ability to provide high levels of detail allows researchers to peer into the previously hidden structures of matter. As we continue to push the boundaries of science, AFM remains a cornerstone in advancing fields and helping us explore new frontiers that were once unimaginable.